ERIF Mid-Term Report Analysis and Optimization of Sequential Circuits under Process Variations

The proposed approach for the statistical static timing analysis (SSTA) problem of latch-based sequential circuits under process variations was investigated. The proposed statistical positive cycle detection algorithm is developed in Section 2. Practical implementation considerations are presented in Section 3. Experimental results are shown in Section 4. Based on the current progress, the future research work will be focused on risk aversion statistical optimizations as proposed in the original proposal.